- This is the entry level training course designed to train new EMP Test users on the MS4200 and MS5200 Series Tester.
- Course duration is 40 hours spread over 5 days, including 18 hrs. of hands-on exercise.
- Centered around the SRAM standard test program it introduces new users to the MS4200 / MS5200 series Tester and the TCS application.
- Main topics include system architecture, data based test philosophy and all the TCS parameter group windows.
Module 1: System Overview / DUT Configuration
· Hardware overview
· Software Architecture
· Introduction to TCS / Sybase
· Device Configuration tool
· Pins and channel Configuration
· Resource Names
· Block, Burst and Command tables
Module 2: Parametric Tests
· Data Based Testing
· TCS User Interface
· Building a Test: SRAM
· DC Parametric
· Power, Matrix, PMU Windows
· Datalogger
Module 3: Functional Tests
· Building a Functional Test
· Pattern Sequence Window
· Pattern Group Window
· Timing Group Window
· Timeset Group Window
· Output Group Window
· Functional Parametric tests
Module 4: Viewing Test Results
· TCS Advanced Features
· Format Group Window
· Datascope Window
· Results Management Database
· Capture / Source system
· CSC Group Window
· BCV Bitmap Viewer
Module 5: Analysis Tests
· Scramble Group Window
· Topological Mapping Overview
· Building an Analysis Tests
· Analysis Test Definition Window
· Axis Group Window
· Plot Group Window
· Calibration & Diagnostics
For more information, please contact your local EPM test representative or email us at support@epmtest.com.
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