MS5205 General Purpose Test System

Hardware Highlights

Data Rate 416 MHz
Clock Rate 416 MHz
Address Rate 208 MHz
Address/Clock 72 channels
Address/Clock pins VHH per pin
Data Width  72 bits
Data Pins PTU per pin


The MS5205 test system can be expanded to 144 pin channels.  Suitable for testing a broad range of memory types, from commodity FLASH, SRAM and DRAM through synchronous device types, such as SBSRAMs and SDR/DDR SDRAMs.

The MS5205 provides functional, AC and DC parametric testing with a scalable test data rate from 104MHz/208Mbps to 208MHz/416 Mbps, coupled with VHH control on every address and clock pin and a Parametric Test Unit (PTU) on each data pin, making the MS5205 test system, ideal for FLASH testing.

The key to improving engineering productivity is our industry acclaimed TCS software interface- that allows our users to focus on the device under test instead of wrestling with the tester.

Tester Control Software (TCS) is based on over 20 years of experience in providing engineers with memory tester software optimized to address the real needs of engineering applications. TCS provides interactive control through an easy to learn and easy to use graphical interface. Test conditions, test flow, multi-parameter analysis tests and more are all instantly changeable. But there are no limits – TCS will also seamlessly integrate your user written custom code needed to meet unique testing requirements.

Modern memories require specific sequences of commands, addresses and data to be operated or tested. That need is answered with our patented Graphical Sequence Editor (GSE) for creating and editing test sequences. With TCS and GSE combined, there is no more efficient and effective tool for creating, modifying and maintaining complex engineering tests and test programs for semiconductor memories.

One of the most powerful tools in identifying and diagnosing weaknesses in a memory device is bitmapping. Our bit-map capture system runs at full tester speed, capturing 1's errors, 0's errors, all errors or a combination of those. With a 32 Gb capacity, the largest memory devices around can be handled with ease. And again, the real key is software. Our bitmap display and analysis software provides rapid navigation, comprehensive analysis and easy export of bit-map data.

The MS5205 is CE and SEMI S2 compliant and packaged in a laboratory-sized cabinet with a compact, remote test head (conforming to the industry standard PXI format). The MS5205 remote test head provides the ppin driver and receiver interface to the device under test with 72 Address/clock, 72 Data I/O pins and 32 Logic Control pins, with additional slots for the addition of third party PXI (6U/3U) instrumentation.