Module 1: System
Overview / DUT Configuration
· Hardware overview
· Software Architecture
· Introduction to TCS / Sybase
· Device Configuration tool
· Pins and channel Configuration
· Resource Names
· Block, Burst and Command tables
Module 2:
Parametric Tests
· Data Based Testing
· TCS User Interface
· Building a Test: SRAM
· DC Parametric
· Power, Matrix, PMU Windows
· Datalogger
Module 3:
Functional Tests
· Building a Functional Test
· Pattern Sequence Window
· Pattern Group Window
· Timing Group Window
· Timeset Group Window
· Output Group Window
· Functional Parametric tests
Module 4:
Viewing Test Results
· TCS Advanced Features
· Format Group Window
· Datascope Window
· Results Management Database
· Capture / Source system
· CSC Group Window
· BCV Bitmap Viewer
Module 5:
Analysis Tests
· Scramble Group Window
· Topological Mapping Overview
· Building an Analysis Tests
· Analysis Test Definition Window
· Axis Group Window
· Plot Group Window
· Calibration & Diagnostics
For more
information, please contact your local EPM
test representative or email us at
support@epmtest.com.